CME and Carrington Event Videos

Solar flare vs. CME:



CME and Carrington Event:

Giant Sun Storm of 2012 Shown in Fiery Detail (Video)

Test Example

1) Какой разрез структуры, изображённый ниже, - правильный (обвести букву)?
What section of the following structure is correct?

a)	b)
с)	d)

Plan of the Course

NOTE: References lead to illustrative materials for the unit.

Units	Topics
1	Introduction. Types of impact. Classification of catastrophic and non-catastrophic failures (hard and soft errors). Materials
2	Physical mechanisms leading to TID in a bulk and SOI MOSFET. TID modelling in a standard VLSI design roadmap.
3	Physical processes in a bulk and SOI MOSFET during a strike of single charged particle. Linear Energy Transfer (LET), error cross-section, fluence, flux. Estimation of saturation cross-section using layout features.
4	The sources of upsets and catastrophic failures in space. Space weather. Natural and artificial radiation belts (Van Allen belts). Classification of spacecraft orbits. Materials
5	Single Event Effects modelling in a standard VLSI design roadmap. The synergy between SEE and TID in CMOS SRAM.
6	TID and SEE in perspective nano-scale double-gate transistors, FinFETs.
7	Hardness assurance. Modeling and imitation tools.
8	Radiation Hardening-by-Process and by-Design methods for TID effects.
9	Radiation Hardening-by-Process and by-Design methods for catastrophic SEE.
10	Architecture and design methods for soft radiation effects.
11	Layout and process-based methods for soft radiation effects.
12	Silicon-on-Insulator technology. Special methods for TID and SEE.
13	Error Correction Codes (ECC).
14	The influence of scaling to SEE and TID sensitivity

Recommended References

There are some recommended references in Russian and in English:

Main:

1) Зебрев Г.И. Физические основы кремниевой наноэлектроники:Учебное пособие. — М.: МИФИ, 2008. — 288 с.

2) Зебрев Г.И. Радиационные эффекты в кремниевых интегральныхсхемах высокой степени интеграции: Учебное пособие. – М.: НИЯУ МИФИ, 2010. –148 с.

3) ТапероК.И., Улимов В.Н., Членов А.М. Радиационные эффекты в кремниевыхинтегральных схемах космического применения. – М.:БИНОМ. Лаборатория знаний,2012. – 309 с.

4) Чумаков А.И.. Действия космической радиации на интегральные схемы. М.: "Радио и связь", 2004 – 319 с.

5) C. Claeys,E. Simoen. Radiation Effects in Advanced Semiconductor Materials and Devices. –Springer, 2002.

6) R.D.Shrimpf, D.M. Fleetwood. Radiation Effects and Soft Errors in IntegratedCircuits and Electronic Devices. – World Scientific Publishing Co.Pte.Ltd.,2004.

7) S.Mukherjee. Architecture Design for Soft Errors. – Elsevier, 2008.

8) RadiationEffects in Semiconductors. Edited by K. Iniewski. – CRC Press, 2011.

9) Richard H. Maurer, Martin E. Fraeman, Mark N. Martin, and David R. Roth. Harsh Environments: Space Radiation Environment, Effects, and Mitigation. Johns Hopkins APL Technical Digest, Volume 28, Number 1 (2008).

Additional:

1) Першенков В.С., Скоробогатов П.К., Улимов В.Н. Дозовые эффекты в изделиях современной микроэлектроники: Учебное пособие. М.: НИЯУ МИФИ, 2011. – 172 с.

2) Никифоров А.Ю., Телец В.А., Чумаков А.И. Радиационные эффекты в КМОП ИС. – М.: Радио и связь, 1994. – 164 с.

3) Першенков В.С., Попов В.Д., Шальнов А.В. Поверхностные радиационные эффекты в элементах интегральных микросхем М.: Энергоатомиздат, 1988.

4) R. Velazco, P. Fouillat, R. Reis. Radiation Effects on EmbeddedSystems. – Springer, 2007.

5) Попов В.Д., Белова Г.Ф. Физические основы проектирования кремниевых цифровых интегральных микросхем в монолитном и гибридном исполнении: Учебное пособие. – СПб.: Издательство «Лань», 2013. – 208 с.

6) F. LimaKastensmidt, L. Carro, R. Reis, “Fault-Tolerance Techniques for SRAM-basedFPGAs”. – Springer, 2006.

Online programs and useful web-sites:

1) http://micro4space.blogspot.ru/

2) https://creme.isde.vanderbilt.edu/

3) http://www.spenvis.oma.be/

4) http://spaceweather.com/

5) http://kosrad.ru/index.php/ru/

6) http://naked-science.ru/article/sci/24-06-2013-110

Single Event Upsets

Spatial distribution of errors from the UoSAT-3 spacecraft in polar orbit:

Note the South Atlantic Anomaly.
(source)

Rockets of the World

Almost all rockets by 1995:

Buran vs. Space Shuttle (source):

Size comparison (source):

Chinese (source):

SpaceX (in use and perspective) (source):

Particles at High Altitudes

(source)

Rising Complexity of CMOS Technology

(from "Collaboration as a Way forward for Semiconductor Technology – Albany NanoTech" by Dr. Gary Patton, Vice President, IBM Semiconductor Research & Development Center, IEEE Fellow)

High-K Gate dielectrics

 

(from dtfl.snu.ac.kr)

 Gate first vs. Gate last process

(from dtfl.snu.ac.kr)

See also

Space Debris: Visualization and Infographics

Here are some visualizations and infographics on space debris problem:

(from awesome.good.is)

(from gizmodo.com)

(from gizmodo.com)

(from space.com)